These VLSI - Very Large Scale Integration multiple-choice questions and their answers will help you strengthen your grip on the subject of VLSI - Very Large Scale Integration. You can prepare for an upcoming exam or job interview with these 70 VLSI - Very Large Scale Integration MCQs.
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A. active devices are used as load
B. active devices are used as elements
C. it is always active in the circuit
D. None of these
A. complex numbers
B. rational numbers
C. even numbers
D. real numbers
A. is dependent on input voltage
B. is dependent on IC
C. is independent of the process
D. All of these
A. contacts
B. cuts
C. vias
D. None of the above
A. 3
B. 4
C. 5
D. 6
A. a past history of values
B. a present history of values
C. a future history of values
D. a history without any values
A. 1/2
B. 1/4
C. 1/3
D. 1/√2
A. should be small
B. should be high
C. should be independent of gm
D. should vary inversely with speed
A. GaAs and silicon
B. GaAs and boron
C. GaAs and AlGaAs
D. GaAs and germanium GaAs
A. small capacitance
B. large capacitance
C. infinite capacitance
D. negligible capacitance
A. It is a process in which a layer of metal is deposited on a silicon wafer
B. It is a process in which a wafer is sliced by a metal
C. It is a process by which the components of an IC are inter connected by an aluminum conductor
D. It is a process in which a metal base is formed below the surface of a wafer
A. 2λ
B. 3λ
C. 4λ
D. 5λ
A. down by α
B. down by α2
C. up by α
D. None of these
A. A set of concurrent statements
B. A set of interconnected components
C. A set of sequential program statements
D. A set of cumulative statements
A. a low resistance path between adjacent devices
B. a low resistance path between the source and the drain
C. a low resistance path between the power supply and the ground
D. None of the above
A. PROMs
B. EAROMs
C. EEPROMs
D. Flash Memory
A. increase the metal area
B. increase the VDD area
C. increase the VSS area
D. None of the above
A. Polysilicon layers
B. Metal Layers
C. Either of the above
D. None of these
A. current Mirrors
B. current Steering Circuits
C. current Sink
D. All of these
A. Simulator
B. Operating system
C. Debugger
D. Real time operating system
A. has low output impedance
B. has high output impedance
C. is the product of output impedance of the two stages used
D. None of the above
A. An entity is a description of the interface between a design and an external environment
B. An entity defines the input and output ports of a design
C. One entity has only one architecture
D. A design can contain more than one entity
A. IN
B. OUT
C. Buffer
D. Tri-state
A. α
B. α2
C. α/2
D. None of the above
A. the current is folded up
B. the current is folded down
C. both of the above
D. none of the above
A. A programmable AND array and a programmable OR array
B. A programmable AND array and a fixed OR array
C. A fixed AND array and a programmable OR array
D. Fixed AND and OR arrays
A. It provides element values
B. It does not provide element values
C. It provides access to objects of a given type
D. It provides access to objects that contain a sequence of values
A. It declares an alternate name for an existing named entity
B. It declares the same name again for an existing named entity
C. It declares a different name for a different entity
D. It declares the already used name for a different entity
A. CMOS
B. ECL
C. BiCMOS
D. GaAs
A. It is used to test the MOS function
B. It is used to test the fan-out of TTL family
C. It is used to test the output impedance of MOS
D. It is used to resolve problems associated with the testing of boards carrying VLSI circuits
A. The Next statement
B. The Exit statement
C. The If statement
D. The Block statement
A. TTL
B. ECL
C. MOS
D. CMOS
A. The main statement
B. The end statement
C. The process statement
D. The signal statement
A. the deposition of oxide in selective areas
B. the selective removal of oxide in the desired areas
C. a process for ion implantation
D. a process for annealing
A. using mos as switch and BJT as driver
B. using mos as driver and BJT as switch
C. using either of the two as driver or switch
D. None of these
A. software design of circuits
B. hardware design of circuits
C. operating system design of circuits
D. real time operating system design of circuits
A. A vacancy in the lattice created due to a missing atom
B. A silicon atom in an interstitial lattice site with an associated vacancy
C. A non silicon atom in an interstitial lattice site with an associated vacancy
D. A vacancy in the lattice created due to a missing molecule
A. When a high resistance path is established between the drain and the source
B. When a high resistance path is established between the drain and the gate
C. When a low resistance path is established between the drain and the source
D. When a low resistance path is established between the drain and the gate
A. down by α resistance
B. down by α2
C. up by α
D. None of these
A. convey the presence of Metal
B. Vconvey the presence of Gate
C. convey the presence of Contact
D. convey the layer information
A. Symmetry of the conventional inverter
B. Low output problem of the conventional inverter
C. Asymmetry of the conventional inverter
D. High output problem of the conventional inverter
A. the sum of the intrinsic gain of the transistors
B. the product of the intrinsic gain of the transistors
C. the square of the intrinsic gain of the transistors
D. None of these
A. VHSIC (very high switching integrated circuit)
B. VHSIC (very high speed integrated circuit)
C. VHSIC (very high speed integrated configuration)
D. VHSIC (verilog high switching integrated circuit)
A. It decreases the input impedance
B. It increases the input impedance
C. The input impedance is independent of the body effect
D. None of these
A. Boron
B. Silicon
C. Germanium
D. Phosphorous
A. Power dissipation
B. High o/p drive current
C. High noise margin
D. Low output drive current
A. the conductors are always parallel
B. the conductors are always orthogonal
C. the conductors are always touching
D. None of the above
A. When the output of design depends on the value of one signal expression
B. When the behavior of design depends on the value of one signal expression
C. When the output of design depends on the value of two signal expression
D. When the behavior of design depends on the value of two signal expressions
A. Voltage signal
B. Current signal
C. Power signal
D. No idea
A. Inverted gain
B. Non inverted gain
C. Gain less than one
D. Unity gain